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Brand Name : Topfer
Model Number : Top-Smart 1100
Place of Origin : China
MOQ : one set
Price : to be discussed
Payment Terms : T/T
Supply Ability : 10 sets /30 days
Delivery Time : 2 to 3 weeks
Packaging Details : wooden crate
Color : gray
simultaneously measurable : 4-16 power supply products
Altitude : 1.7m
Customizable : Yes
Product Usage : Automatic Testing for Adapter Products
Function : Rapidly test the performance of various power supply products.
Power ate test system, PC power test, OCP/OVP/SHORT functional test module test system
1. High degree of automation enhances testing efficiency
Automatically execute the test process: Through preset programs, automatically complete tests on input/output characteristics, protection functions, energy efficiency, etc., reducing manual operation time.
Multi-channel parallel testing: Supports simultaneous testing of multiple power supply samples, significantly shortening the batch testing cycle (such as full inspection of fast charging power sources on the production line).
7× 24-hour continuous operation: Suitable for scenarios such as aging tests and life tests, no manual intervention is required.
2. High testing accuracy and traceable data
Accurately measure key parameters:
Voltage/current accuracy: Up to 0.1% range accuracy (such as output from a 5V/1A adapter).
Ripple noise: Resolution up to 1mVpp (oscilloscope-level measurement).
Energy efficiency test: The error of the power analyzer is <0.5% (meeting the DoE/ Energy Star standard).
Eliminate human errors: Automate data collection to avoid deviations from manual reading or recording.
Data storage and traceability: Test results are automatically generated into Excel/PDF reports, supporting barcode scanning to associate sample information.
Open
General
Professional
High-speed
Test Items of the Charger Automatic Testing System Top-Smart 1100:
| Test items | Test items | 
| DC output voltage | Input voltage ramp | 
| DC output current | Input freq. ramp | 
| Peak-Peak noise | Tracking | 
| Transient response time | Short circuit test | 
| Transient spike | Short circuit current | 
| Voltage regulation | OV protection | 
| Current regulation | UV protection | 
| Turn ON time | OL protection | 
| Rise time | OP protection | 
| Fall time | In-test adjustment | 
| Hold-up time | AC cycle drop out | 
| Inrush current test | PLD simulation | 
| Power good signal | GPIB read/write | 
| Power fail signal | 232 read/write | 
| P/S ON signal | USB read/write | 
| Power up sequence | TTL signal control | 
| Power off sequence | Relay control | 
| Effciency | Bar code scan | 
| Input RMS current | Dynamic test | 
| Input power | DC Current under C.V.Mode | 
| Input power factor | DC : specification under C.P.Mode | 
 
 
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